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Answering some questions about structured illumination microscopy
Structured illumination microscopy (SIM) provides images of fluorescent objects at an enhanced resolution greater than that of conventional epifluorescence wide-field microscopy. Initially demonstrated in 1999 to enhance the lateral resolution twofold, it has since been extended to enhance axial res...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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The Royal Society
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8841787/ https://www.ncbi.nlm.nih.gov/pubmed/35152757 http://dx.doi.org/10.1098/rsta.2021.0109 |