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Structural properties of Bi thin film grown on Si (111) by quasi-van der Waals epitaxy
Crystallinity of an 80-nm-thick bismuth thin film grown on Si (111) substrate by MBE was investigated. The highly (0003) textured Bi film contains two twinning domains with different bilayer stacking sequences. The basic lattice parameters c and a as well as b, the bilayer thickness, of the two doma...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8854617/ https://www.ncbi.nlm.nih.gov/pubmed/35177684 http://dx.doi.org/10.1038/s41598-022-06472-5 |