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Digital Twin for Training Bayesian Networks for Fault Diagnostics of Manufacturing Systems

Smart manufacturing systems are being advocated to leverage technological advances that enable them to be more resilient to faults through rapid diagnosis for performance assurance. In this paper, we propose a co-simulation approach for engineering digital twins (DTs) that are used to train Bayesian...

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Detalles Bibliográficos
Autores principales: Ademujimi, Toyosi, Prabhu, Vittaldas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8874643/
https://www.ncbi.nlm.nih.gov/pubmed/35214332
http://dx.doi.org/10.3390/s22041430