Cryogenic Focused Ion Beam Enables Atomic-Resolution Imaging of Local Structures in Highly Sensitive Bulk Crystals and Devices

[Image: see text] With the development of ultralow-dose (scanning) transmission electron microscopy ((S)TEM) techniques, atomic-resolution imaging of highly sensitive nanomaterials has recently become possible. However, applying these techniques to the study of sensitive bulk materials remains chall...

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Detalles Bibliográficos
Autores principales: Zhou, Jinfei, Wei, Nini, Zhang, Daliang, Wang, Yujiao, Li, Jingwei, Zheng, Xiaopeng, Wang, Jianjian, Alsalloum, Abdullah Y., Liu, Lingmei, Bakr, Osman M., Han, Yu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8874919/
https://www.ncbi.nlm.nih.gov/pubmed/35157426
http://dx.doi.org/10.1021/jacs.1c12794

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8874919/
https://www.ncbi.nlm.nih.gov/pubmed/35157426
http://dx.doi.org/10.1021/jacs.1c12794

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