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Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices
The high-performance room-temperature-operating Si single-electron transistors (SETs) were devised in the form of the multiple quantum-dot (MQD) multiple tunnel junction (MTJ) system. The key device architecture of the Si MQD MTJ system was self-formed along the volumetrically undulated [110] Si nan...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8876062/ https://www.ncbi.nlm.nih.gov/pubmed/35214932 http://dx.doi.org/10.3390/nano12040603 |
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author | Lee, Youngmin Lee, So Hyun Son, Hyo Seok Lee, Sejoon |
author_facet | Lee, Youngmin Lee, So Hyun Son, Hyo Seok Lee, Sejoon |
author_sort | Lee, Youngmin |
collection | PubMed |
description | The high-performance room-temperature-operating Si single-electron transistors (SETs) were devised in the form of the multiple quantum-dot (MQD) multiple tunnel junction (MTJ) system. The key device architecture of the Si MQD MTJ system was self-formed along the volumetrically undulated [110] Si nanowire that was fabricated by isotropic wet etching and subsequent oxidation of the e-beam-lithographically patterned [110] Si nanowire. The strong subband modulation in the volumetrically undulated [110] Si nanowire could create both the large quantum level spacings and the high tunnel barriers in the Si MQD MTJ system. Such a device scheme can not only decrease the cotunneling effect, but also reduce the effective electron temperature. These eventually led to the energetic stability for both the Coulomb blockade and the negative differential conductance characteristics at room temperature. The results suggest that the present device scheme (i.e., [110] Si MQD MTJ) holds great promise for the room-temperature demonstration of the high-performance Si SETs. |
format | Online Article Text |
id | pubmed-8876062 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-88760622022-02-26 Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices Lee, Youngmin Lee, So Hyun Son, Hyo Seok Lee, Sejoon Nanomaterials (Basel) Article The high-performance room-temperature-operating Si single-electron transistors (SETs) were devised in the form of the multiple quantum-dot (MQD) multiple tunnel junction (MTJ) system. The key device architecture of the Si MQD MTJ system was self-formed along the volumetrically undulated [110] Si nanowire that was fabricated by isotropic wet etching and subsequent oxidation of the e-beam-lithographically patterned [110] Si nanowire. The strong subband modulation in the volumetrically undulated [110] Si nanowire could create both the large quantum level spacings and the high tunnel barriers in the Si MQD MTJ system. Such a device scheme can not only decrease the cotunneling effect, but also reduce the effective electron temperature. These eventually led to the energetic stability for both the Coulomb blockade and the negative differential conductance characteristics at room temperature. The results suggest that the present device scheme (i.e., [110] Si MQD MTJ) holds great promise for the room-temperature demonstration of the high-performance Si SETs. MDPI 2022-02-11 /pmc/articles/PMC8876062/ /pubmed/35214932 http://dx.doi.org/10.3390/nano12040603 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Lee, Youngmin Lee, So Hyun Son, Hyo Seok Lee, Sejoon Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title | Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title_full | Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title_fullStr | Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title_full_unstemmed | Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title_short | Reduced Electron Temperature in Silicon Multi-Quantum-Dot Single-Electron Tunneling Devices |
title_sort | reduced electron temperature in silicon multi-quantum-dot single-electron tunneling devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8876062/ https://www.ncbi.nlm.nih.gov/pubmed/35214932 http://dx.doi.org/10.3390/nano12040603 |
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