Impact of the structure on the thermal burnout effect induced by microwave pulses of PIN limiter diodes

Positive-intrinsic-negative (PIN) limiters are widely used to protect sensitive components from leakage power itself and adjacent high-power injection. Being the core of a PIN limiter, the PIN diode is possible to be burnt out by the external microwave pulses. Here, using a parallel computing progra...

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Detalles Bibliográficos
Autores principales: Zhao, Jingtao, Chen, Quanyou, Chen, Zhidong, Chen, Chaoyang, Zhao, Zhenguo, Liu, Zhong, Zhao, Gang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8881575/
https://www.ncbi.nlm.nih.gov/pubmed/35217765
http://dx.doi.org/10.1038/s41598-022-07326-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8881575/
https://www.ncbi.nlm.nih.gov/pubmed/35217765
http://dx.doi.org/10.1038/s41598-022-07326-w

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