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Impact of the structure on the thermal burnout effect induced by microwave pulses of PIN limiter diodes
Positive-intrinsic-negative (PIN) limiters are widely used to protect sensitive components from leakage power itself and adjacent high-power injection. Being the core of a PIN limiter, the PIN diode is possible to be burnt out by the external microwave pulses. Here, using a parallel computing progra...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8881575/ https://www.ncbi.nlm.nih.gov/pubmed/35217765 http://dx.doi.org/10.1038/s41598-022-07326-w |