An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

An error in Fig. 3 ▸(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.

Detalles Bibliográficos
Autores principales: Assalauova, Dameli, Kim, Young Yong, Bobkov, Sergey, Khubbutdinov, Ruslan, Rose, Max, Alvarez, Roberto, Andreasson, Jakob, Balaur, Eugeniu, Contreras, Alice, DeMirci, Hasan, Gelisio, Luca, Hajdu, Janos, Hunter, Mark S., Kurta, Ruslan P., Li, Haoyuan, McFadden, Matthew, Nazari, Reza, Schwander, Peter, Teslyuk, Anton, Walter, Peter, Xavier, P. Lourdu, Yoon, Chun Hong, Zaare, Sahba, Ilyin, Viacheslav A., Kirian, Richard A., Hogue, Brenda G., Aquila, Andrew, Vartanyants, Ivan A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Addenda and Errata
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895016/
https://www.ncbi.nlm.nih.gov/pubmed/35371497
http://dx.doi.org/10.1107/S2052252522000501

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895016/
https://www.ncbi.nlm.nih.gov/pubmed/35371497
http://dx.doi.org/10.1107/S2052252522000501

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