Investigation of a memory effect in a Au/(Ti–Cu)Ox-gradient thin film/TiAlV structure

This paper presents the results of the analysis of resistive switching properties observed in a Au/(Ti–Cu)Ox/TiAlV structure with a gradient distribution of Cu and Ti along the (Ti–Cu)Ox thin film thickness. Thin films were prepared via multisource reactive magnetron co-sputtering. The programmed pr...

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Detalles Bibliográficos
Autores principales: Wojcieszak, Damian, Domaradzki, Jarosław, Mazur, Michał, Kotwica, Tomasz, Kaczmarek, Danuta
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2022
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895032/
https://www.ncbi.nlm.nih.gov/pubmed/35281631
http://dx.doi.org/10.3762/bjnano.13.21

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895032/
https://www.ncbi.nlm.nih.gov/pubmed/35281631
http://dx.doi.org/10.3762/bjnano.13.21

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