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Using diffraction losses of X-rays in a single crystal for determination of its lattice parameters as well as for monochromator calibration
A way has been developed to measure the unit-cell parameters of a single crystal just from an energy scan with X-rays, even when the exact energy of the X-rays is not well defined due to an error in the pitch angle of the monochromator. The precision of this measurement reaches da/a ∼ 1 × 10(−5). Th...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8900831/ https://www.ncbi.nlm.nih.gov/pubmed/35254299 http://dx.doi.org/10.1107/S1600577521013667 |