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Diffuse X-ray scattering from polished silicon: application of the distorted wave Born approximation
Measured diffuse X-ray scattering data for a ‘smooth’ as well as for a ‘rough’ silicon sample were fit to theoretical expressions within the distorted wave Born approximation (DWBA). Data for the power spectral density (PSD) for both samples were also obtained by means of atomic force microscopy and...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8900862/ https://www.ncbi.nlm.nih.gov/pubmed/35254308 http://dx.doi.org/10.1107/S1600577522000534 |