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Corn Seed Defect Detection Based on Watershed Algorithm and Two-Pathway Convolutional Neural Networks

Corn seed materials of different quality were imaged, and a method for defect detection was developed based on a watershed algorithm combined with a two-pathway convolutional neural network (CNN) model. In this study, RGB and near-infrared (NIR) images were acquired with a multispectral camera to tr...

詳細記述

書誌詳細
主要な著者: Wang, Linbai, Liu, Jingyan, Zhang, Jun, Wang, Jing, Fan, Xiaofei
フォーマット: Online 論文 テキスト
言語:English
出版事項: Frontiers Media S.A. 2022
主題:
オンライン・アクセス:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8905238/
https://www.ncbi.nlm.nih.gov/pubmed/35283875
http://dx.doi.org/10.3389/fpls.2022.730190