Boxcar Averaging Scanning Nonlinear Dielectric Microscopy

Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors. This microscopy method has often been combined with contact-mode atomic force microscopy (...

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Detalles Bibliográficos
Autores principales: Yamasue, Kohei, Cho, Yasuo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8912340/
https://www.ncbi.nlm.nih.gov/pubmed/35269282
http://dx.doi.org/10.3390/nano12050794

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8912340/
https://www.ncbi.nlm.nih.gov/pubmed/35269282
http://dx.doi.org/10.3390/nano12050794

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