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Boxcar Averaging Scanning Nonlinear Dielectric Microscopy
Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors. This microscopy method has often been combined with contact-mode atomic force microscopy (...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8912340/ https://www.ncbi.nlm.nih.gov/pubmed/35269282 http://dx.doi.org/10.3390/nano12050794 |