Very-high-frequency probes for atomic force microscopy with silicon optomechanics

Atomic force microscopy (AFM) has been consistently supporting nanosciences and nanotechnologies for over 30 years and is used in many fields from condensed matter physics to biology. It enables the measurement of very weak forces at the nanoscale, thus elucidating the interactions at play in fundam...

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Detalles Bibliográficos
Autores principales: Schwab, L., Allain, P. E., Mauran, N., Dollat, X., Mazenq, L., Lagrange, D., Gély, M., Hentz, S., Jourdan, G., Favero, I., Legrand, B.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8931076/
https://www.ncbi.nlm.nih.gov/pubmed/35371536
http://dx.doi.org/10.1038/s41378-022-00364-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8931076/
https://www.ncbi.nlm.nih.gov/pubmed/35371536
http://dx.doi.org/10.1038/s41378-022-00364-4

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