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Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity
[Image: see text] Synchrotron-based X-ray fluorescence microscopy (XFM) analysis is a powerful technique that can be used to visualize elemental distributions across a broad range of sample types. Compared to conventional mapping techniques such as laser ablation inductively coupled plasma mass spec...
Autores principales: | , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2022
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8943523/ https://www.ncbi.nlm.nih.gov/pubmed/35276040 http://dx.doi.org/10.1021/acs.analchem.1c04255 |