Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity

[Image: see text] Synchrotron-based X-ray fluorescence microscopy (XFM) analysis is a powerful technique that can be used to visualize elemental distributions across a broad range of sample types. Compared to conventional mapping techniques such as laser ablation inductively coupled plasma mass spec...

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Detalles Bibliográficos
Autores principales: Doolette, Casey L., Howard, Daryl L., Afshar, Nader, Kewish, Cameron M., Paterson, David J., Huang, Jianyin, Wagner, Stefan, Santner, Jakob, Wenzel, Walter W., Raimondo, Tom, De Vries Van Leeuwen, Alexander T., Hou, Lei, van der Bom, Frederik, Weng, Han, Kopittke, Peter M., Lombi, Enzo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8943523/
https://www.ncbi.nlm.nih.gov/pubmed/35276040
http://dx.doi.org/10.1021/acs.analchem.1c04255

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