A Novel Feature Extraction Algorithm and System for Flexible Integrated Circuit Packaging Substrate

Aiming at the line defect detection of a flexible integrated circuit substrate (FICS) without reference template, there are some problems such as line discontinuity or inaccurate line defect location in the detection results. In order to address these problems, a line feature detection algorithm for...

Descripción completa

Detalles Bibliográficos
Autores principales: Huang, Dan, Wang, Juan, Zeng, Yong, Yu, Yongxing, Hu, Yueming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8951624/
https://www.ncbi.nlm.nih.gov/pubmed/35334682
http://dx.doi.org/10.3390/mi13030391

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8951624/
https://www.ncbi.nlm.nih.gov/pubmed/35334682
http://dx.doi.org/10.3390/mi13030391

Ejemplares similares