Cargando…
On-Chip Structures for F(max) Binning and Optimization †
Process variations during manufacturing lead to differences in the performance of the chips. In order to better utilize the performance of the chips, it is necessary to perform maximum operation frequency ([Formula: see text]) tests to place the chips into different speed bins. For most [Formula: se...
| Autores principales: | , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8963108/ https://www.ncbi.nlm.nih.gov/pubmed/35214283 http://dx.doi.org/10.3390/s22041382 |