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Investigation of correlative parameters to evaluate EUV lithographic performance of PMMA
Investigations to evaluate the extreme ultraviolet (EUV) lithographic performance of 160 nm thick poly(methyl methacrylate) with 13.5 nm wavelength EUV light were performed using a synchrotron radiation source at Pohang Light Source-II (PLS-II). The single system enabled the determination of the sen...
Autores principales: | Kim, Kanghyun, Lee, Jong-Won, Park, Byeong-Gyu, Oh, Hyun-Taek, Ku, Yejin, Lee, Jin-Kyun, Lim, Geunbae, Lee, Sangsul |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8979033/ https://www.ncbi.nlm.nih.gov/pubmed/35425284 http://dx.doi.org/10.1039/d1ra07291a |
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