In situ Chemical Profiling and Imaging of Cultured and Natural Cordyceps sinensis by TOF-SIMS

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrice...

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Detalles Bibliográficos
Autores principales: Liu, Qian-Bao, Lu, Jing-Guang, Jiang, Zhi-Hong, Zhang, Wei, Li, Wen-Jia, Qian, Zheng-Ming, Bai, Li-Ping
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8987775/
https://www.ncbi.nlm.nih.gov/pubmed/35402389
http://dx.doi.org/10.3389/fchem.2022.862007

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8987775/
https://www.ncbi.nlm.nih.gov/pubmed/35402389
http://dx.doi.org/10.3389/fchem.2022.862007

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