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In situ Chemical Profiling and Imaging of Cultured and Natural Cordyceps sinensis by TOF-SIMS
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrice...
Autores principales: | Liu, Qian-Bao, Lu, Jing-Guang, Jiang, Zhi-Hong, Zhang, Wei, Li, Wen-Jia, Qian, Zheng-Ming, Bai, Li-Ping |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8987775/ https://www.ncbi.nlm.nih.gov/pubmed/35402389 http://dx.doi.org/10.3389/fchem.2022.862007 |
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