Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays

Laser-induced camera damage thresholds were measured for several sensors of three different sensor architectures using a Q-switched Nd:YAG laser in order to determine their pulsed laser-induced damage thresholds. Charge coupled device (CCD), front-side illuminated complimentary metal-oxide semicondu...

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Detalles Bibliográficos
Autores principales: Westgate, Christopher, James, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9002732/
https://www.ncbi.nlm.nih.gov/pubmed/35408138
http://dx.doi.org/10.3390/s22072526

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9002732/
https://www.ncbi.nlm.nih.gov/pubmed/35408138
http://dx.doi.org/10.3390/s22072526

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