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Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays
Laser-induced camera damage thresholds were measured for several sensors of three different sensor architectures using a Q-switched Nd:YAG laser in order to determine their pulsed laser-induced damage thresholds. Charge coupled device (CCD), front-side illuminated complimentary metal-oxide semicondu...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9002732/ https://www.ncbi.nlm.nih.gov/pubmed/35408138 http://dx.doi.org/10.3390/s22072526 |