On-Machine Detection of Sub-Microscale Defects in Diamond Tool Grinding during the Manufacturing Process Based on DToolnet

Nowadays, tool condition monitoring (TCM), which can prevent the waste of resources and improve efficiency in the process of machining parts, has developed many mature methods. However, TCM during the production of cutting tools is less studied and has different properties. The scale of the defects...

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Detalles Bibliográficos
Autores principales: Xue, Wen, Zhao, Chenyang, Fu, Wenpeng, Du, Jianjun, Yao, Yingxue
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003466/
https://www.ncbi.nlm.nih.gov/pubmed/35408041
http://dx.doi.org/10.3390/s22072426

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003466/
https://www.ncbi.nlm.nih.gov/pubmed/35408041
http://dx.doi.org/10.3390/s22072426

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