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Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering,...
Autores principales: | , , , , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/ https://www.ncbi.nlm.nih.gov/pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 |
Sumario: | In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering, competitive driving capability and switching properties are achieved in comparison to the conventional devices fabricated with a standard high-temperature (≥1000 °C) process flow. Schottky S/D PMOS exhibits an ON-state current (I(ON)) of 76.07 μA/μm and ON-state to OFF-state current ratio (I(ON)/I(OFF)) of 7 × 10(5), and those for NMOS are 48.57 μA/μm and 1 × 10(6). The CMOS inverter shows a voltage gain of 18V/V, a noise margin for high (NM(H)) of 0.17 V and for low (NM(L)) of 0.43 V, with power consumption less than 0.9 μW at V(DD) of 0.8 V. Full functionality of CMOS ring oscillators (RO) are further demonstrated. |
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