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Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering,...
Autores principales: | , , , , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/ https://www.ncbi.nlm.nih.gov/pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 |
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author | Mao, Shujuan Gao, Jianfeng He, Xiaobin Liu, Weibing Liu, Jinbiao Wang, Guilei Zhou, Na Luo, Yanna Cao, Lei Zhang, Ran Liu, Haochen Li, Xun Li, Yongliang Wu, Zhenhua Li, Junfeng Luo, Jun Zhao, Chao Wang, Wenwu Yin, Huaxiang |
author_facet | Mao, Shujuan Gao, Jianfeng He, Xiaobin Liu, Weibing Liu, Jinbiao Wang, Guilei Zhou, Na Luo, Yanna Cao, Lei Zhang, Ran Liu, Haochen Li, Xun Li, Yongliang Wu, Zhenhua Li, Junfeng Luo, Jun Zhao, Chao Wang, Wenwu Yin, Huaxiang |
author_sort | Mao, Shujuan |
collection | PubMed |
description | In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering, competitive driving capability and switching properties are achieved in comparison to the conventional devices fabricated with a standard high-temperature (≥1000 °C) process flow. Schottky S/D PMOS exhibits an ON-state current (I(ON)) of 76.07 μA/μm and ON-state to OFF-state current ratio (I(ON)/I(OFF)) of 7 × 10(5), and those for NMOS are 48.57 μA/μm and 1 × 10(6). The CMOS inverter shows a voltage gain of 18V/V, a noise margin for high (NM(H)) of 0.17 V and for low (NM(L)) of 0.43 V, with power consumption less than 0.9 μW at V(DD) of 0.8 V. Full functionality of CMOS ring oscillators (RO) are further demonstrated. |
format | Online Article Text |
id | pubmed-9003556 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-90035562022-04-13 Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration Mao, Shujuan Gao, Jianfeng He, Xiaobin Liu, Weibing Liu, Jinbiao Wang, Guilei Zhou, Na Luo, Yanna Cao, Lei Zhang, Ran Liu, Haochen Li, Xun Li, Yongliang Wu, Zhenhua Li, Junfeng Luo, Jun Zhao, Chao Wang, Wenwu Yin, Huaxiang Nanomaterials (Basel) Article In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering, competitive driving capability and switching properties are achieved in comparison to the conventional devices fabricated with a standard high-temperature (≥1000 °C) process flow. Schottky S/D PMOS exhibits an ON-state current (I(ON)) of 76.07 μA/μm and ON-state to OFF-state current ratio (I(ON)/I(OFF)) of 7 × 10(5), and those for NMOS are 48.57 μA/μm and 1 × 10(6). The CMOS inverter shows a voltage gain of 18V/V, a noise margin for high (NM(H)) of 0.17 V and for low (NM(L)) of 0.43 V, with power consumption less than 0.9 μW at V(DD) of 0.8 V. Full functionality of CMOS ring oscillators (RO) are further demonstrated. MDPI 2022-04-05 /pmc/articles/PMC9003556/ /pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Mao, Shujuan Gao, Jianfeng He, Xiaobin Liu, Weibing Liu, Jinbiao Wang, Guilei Zhou, Na Luo, Yanna Cao, Lei Zhang, Ran Liu, Haochen Li, Xun Li, Yongliang Wu, Zhenhua Li, Junfeng Luo, Jun Zhao, Chao Wang, Wenwu Yin, Huaxiang Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title | Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title_full | Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title_fullStr | Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title_full_unstemmed | Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title_short | Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration |
title_sort | low-temperature (≤500 °c) complementary schottky source/drain finfets for 3d sequential integration |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/ https://www.ncbi.nlm.nih.gov/pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 |
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