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Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration

In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering,...

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Autores principales: Mao, Shujuan, Gao, Jianfeng, He, Xiaobin, Liu, Weibing, Liu, Jinbiao, Wang, Guilei, Zhou, Na, Luo, Yanna, Cao, Lei, Zhang, Ran, Liu, Haochen, Li, Xun, Li, Yongliang, Wu, Zhenhua, Li, Junfeng, Luo, Jun, Zhao, Chao, Wang, Wenwu, Yin, Huaxiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/
https://www.ncbi.nlm.nih.gov/pubmed/35407340
http://dx.doi.org/10.3390/nano12071218
_version_ 1784686157833961472
author Mao, Shujuan
Gao, Jianfeng
He, Xiaobin
Liu, Weibing
Liu, Jinbiao
Wang, Guilei
Zhou, Na
Luo, Yanna
Cao, Lei
Zhang, Ran
Liu, Haochen
Li, Xun
Li, Yongliang
Wu, Zhenhua
Li, Junfeng
Luo, Jun
Zhao, Chao
Wang, Wenwu
Yin, Huaxiang
author_facet Mao, Shujuan
Gao, Jianfeng
He, Xiaobin
Liu, Weibing
Liu, Jinbiao
Wang, Guilei
Zhou, Na
Luo, Yanna
Cao, Lei
Zhang, Ran
Liu, Haochen
Li, Xun
Li, Yongliang
Wu, Zhenhua
Li, Junfeng
Luo, Jun
Zhao, Chao
Wang, Wenwu
Yin, Huaxiang
author_sort Mao, Shujuan
collection PubMed
description In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering, competitive driving capability and switching properties are achieved in comparison to the conventional devices fabricated with a standard high-temperature (≥1000 °C) process flow. Schottky S/D PMOS exhibits an ON-state current (I(ON)) of 76.07 μA/μm and ON-state to OFF-state current ratio (I(ON)/I(OFF)) of 7 × 10(5), and those for NMOS are 48.57 μA/μm and 1 × 10(6). The CMOS inverter shows a voltage gain of 18V/V, a noise margin for high (NM(H)) of 0.17 V and for low (NM(L)) of 0.43 V, with power consumption less than 0.9 μW at V(DD) of 0.8 V. Full functionality of CMOS ring oscillators (RO) are further demonstrated.
format Online
Article
Text
id pubmed-9003556
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-90035562022-04-13 Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration Mao, Shujuan Gao, Jianfeng He, Xiaobin Liu, Weibing Liu, Jinbiao Wang, Guilei Zhou, Na Luo, Yanna Cao, Lei Zhang, Ran Liu, Haochen Li, Xun Li, Yongliang Wu, Zhenhua Li, Junfeng Luo, Jun Zhao, Chao Wang, Wenwu Yin, Huaxiang Nanomaterials (Basel) Article In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering, competitive driving capability and switching properties are achieved in comparison to the conventional devices fabricated with a standard high-temperature (≥1000 °C) process flow. Schottky S/D PMOS exhibits an ON-state current (I(ON)) of 76.07 μA/μm and ON-state to OFF-state current ratio (I(ON)/I(OFF)) of 7 × 10(5), and those for NMOS are 48.57 μA/μm and 1 × 10(6). The CMOS inverter shows a voltage gain of 18V/V, a noise margin for high (NM(H)) of 0.17 V and for low (NM(L)) of 0.43 V, with power consumption less than 0.9 μW at V(DD) of 0.8 V. Full functionality of CMOS ring oscillators (RO) are further demonstrated. MDPI 2022-04-05 /pmc/articles/PMC9003556/ /pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Mao, Shujuan
Gao, Jianfeng
He, Xiaobin
Liu, Weibing
Liu, Jinbiao
Wang, Guilei
Zhou, Na
Luo, Yanna
Cao, Lei
Zhang, Ran
Liu, Haochen
Li, Xun
Li, Yongliang
Wu, Zhenhua
Li, Junfeng
Luo, Jun
Zhao, Chao
Wang, Wenwu
Yin, Huaxiang
Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title_full Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title_fullStr Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title_full_unstemmed Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title_short Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
title_sort low-temperature (≤500 °c) complementary schottky source/drain finfets for 3d sequential integration
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/
https://www.ncbi.nlm.nih.gov/pubmed/35407340
http://dx.doi.org/10.3390/nano12071218
work_keys_str_mv AT maoshujuan lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT gaojianfeng lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT hexiaobin lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT liuweibing lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT liujinbiao lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT wangguilei lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT zhouna lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT luoyanna lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT caolei lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT zhangran lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT liuhaochen lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT lixun lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT liyongliang lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT wuzhenhua lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT lijunfeng lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT luojun lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT zhaochao lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT wangwenwu lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration
AT yinhuaxiang lowtemperature500ccomplementaryschottkysourcedrainfinfetsfor3dsequentialintegration