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Low-Temperature (≤500 °C) Complementary Schottky Source/Drain FinFETs for 3D Sequential Integration
In this work, low-temperature Schottky source/drain (S/D) MOSFETs are investigated as the top-tier devices for 3D sequential integration. Complementary Schottky S/D FinFETs are successfully fabricated with a maximum processing temperature of 500 °C. Through source/drain extension (SDE) engineering,...
Autores principales: | Mao, Shujuan, Gao, Jianfeng, He, Xiaobin, Liu, Weibing, Liu, Jinbiao, Wang, Guilei, Zhou, Na, Luo, Yanna, Cao, Lei, Zhang, Ran, Liu, Haochen, Li, Xun, Li, Yongliang, Wu, Zhenhua, Li, Junfeng, Luo, Jun, Zhao, Chao, Wang, Wenwu, Yin, Huaxiang |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9003556/ https://www.ncbi.nlm.nih.gov/pubmed/35407340 http://dx.doi.org/10.3390/nano12071218 |
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