A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion Photogrammetry

Scanning electron microscopy (SEM) has been frequently used for size and shape measurements of particles. SEM images offer two-dimensional (2D) information about a particle’s lateral dimensions. Unfortunately, information about the particle’s three-dimensional (3D) size and shape remains unavailable...

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Detalles Bibliográficos
Autor principal: Tondare, Vipin N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9017872/
https://www.ncbi.nlm.nih.gov/pubmed/35465391
http://dx.doi.org/10.6028/jres.125.014

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9017872/
https://www.ncbi.nlm.nih.gov/pubmed/35465391
http://dx.doi.org/10.6028/jres.125.014

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