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X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects
The quantification and localization of elastic strains and defects in crystals are necessary to control and predict the functioning of materials. The X-ray imaging of strains has made very impressive progress in recent years. On the one hand, progress in optical elements for focusing X-rays now make...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9024510/ https://www.ncbi.nlm.nih.gov/pubmed/35458070 http://dx.doi.org/10.3390/nano12081363 |