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X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects

The quantification and localization of elastic strains and defects in crystals are necessary to control and predict the functioning of materials. The X-ray imaging of strains has made very impressive progress in recent years. On the one hand, progress in optical elements for focusing X-rays now make...

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Detalles Bibliográficos
Autores principales:	Thomas, Olivier, Labat, Stéphane, Cornelius, Thomas, Richard, Marie-Ingrid
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2022
Materias:	Review
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9024510/ https://www.ncbi.nlm.nih.gov/pubmed/35458070 http://dx.doi.org/10.3390/nano12081363

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