Skew-Circulant-Matrix-Based Harmonic-Canceling Synthesizer for BIST Applications

Testing is an important part of the design flow in the semiconductor industry. Unfortunately, it also consumes up to half of the production cost. On-silicon stimulus generators and response analyzers can be integrated with the Device-Under-Test (DUT) to reduce production costs with a minimum increme...

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Detalles Bibliográficos
Autores principales: Garayar-Leyva, Guillermo G., Osman, Hatem, Estrada-López, Johan J., Moreira-Tamayo, Oscar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9028868/
https://www.ncbi.nlm.nih.gov/pubmed/35458869
http://dx.doi.org/10.3390/s22082884

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9028868/
https://www.ncbi.nlm.nih.gov/pubmed/35458869
http://dx.doi.org/10.3390/s22082884

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