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Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation

A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which...

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Autores principales: Zhao, Dongyan, Wang, Yubo, Chen, Yanning, Shao, Jin, Fu, Zhen, Duan, Baoxing, Liu, Fang, Li, Xiuwei, Li, Tenghao, Yang, Xin, Li, Mingzhe, Yang, Yintang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031301/
https://www.ncbi.nlm.nih.gov/pubmed/35457878
http://dx.doi.org/10.3390/mi13040573
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author Zhao, Dongyan
Wang, Yubo
Chen, Yanning
Shao, Jin
Fu, Zhen
Duan, Baoxing
Liu, Fang
Li, Xiuwei
Li, Tenghao
Yang, Xin
Li, Mingzhe
Yang, Yintang
author_facet Zhao, Dongyan
Wang, Yubo
Chen, Yanning
Shao, Jin
Fu, Zhen
Duan, Baoxing
Liu, Fang
Li, Xiuwei
Li, Tenghao
Yang, Xin
Li, Mingzhe
Yang, Yintang
author_sort Zhao, Dongyan
collection PubMed
description A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which transfers the breakdown point from the high electric field region to the low electric field region, and the S-FLI VDMOS structure uses multiple layers of charge compensation blocks to generate multiple electric field peaks in the drift region in order to optimize the electric field distribution. In the TCAD simulation, the BV of the proposed S-FLI VDMOS is improved to 326 V, which is higher than that of 281 V for the conventional Si VDMOS with the same drift region length of 15 μm, and the R(on,sp) is reduced from 21.54 mΩ·cm(2) for the conventional Si VDMOS to 7.77 mΩ·cm(2) for the S-FLI VDMOS. Compared with the conventional Si VDMOS, the current density of the effective current conduction path is increased when the forward bias is applied to the proposed device.
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spelling pubmed-90313012022-04-23 Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation Zhao, Dongyan Wang, Yubo Chen, Yanning Shao, Jin Fu, Zhen Duan, Baoxing Liu, Fang Li, Xiuwei Li, Tenghao Yang, Xin Li, Mingzhe Yang, Yintang Micromachines (Basel) Article A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which transfers the breakdown point from the high electric field region to the low electric field region, and the S-FLI VDMOS structure uses multiple layers of charge compensation blocks to generate multiple electric field peaks in the drift region in order to optimize the electric field distribution. In the TCAD simulation, the BV of the proposed S-FLI VDMOS is improved to 326 V, which is higher than that of 281 V for the conventional Si VDMOS with the same drift region length of 15 μm, and the R(on,sp) is reduced from 21.54 mΩ·cm(2) for the conventional Si VDMOS to 7.77 mΩ·cm(2) for the S-FLI VDMOS. Compared with the conventional Si VDMOS, the current density of the effective current conduction path is increased when the forward bias is applied to the proposed device. MDPI 2022-04-04 /pmc/articles/PMC9031301/ /pubmed/35457878 http://dx.doi.org/10.3390/mi13040573 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Zhao, Dongyan
Wang, Yubo
Chen, Yanning
Shao, Jin
Fu, Zhen
Duan, Baoxing
Liu, Fang
Li, Xiuwei
Li, Tenghao
Yang, Xin
Li, Mingzhe
Yang, Yintang
Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title_full Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title_fullStr Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title_full_unstemmed Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title_short Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
title_sort novel step floating islands vdmos with low specific on-resistance by tcad simulation
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031301/
https://www.ncbi.nlm.nih.gov/pubmed/35457878
http://dx.doi.org/10.3390/mi13040573
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