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Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation
A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031301/ https://www.ncbi.nlm.nih.gov/pubmed/35457878 http://dx.doi.org/10.3390/mi13040573 |
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author | Zhao, Dongyan Wang, Yubo Chen, Yanning Shao, Jin Fu, Zhen Duan, Baoxing Liu, Fang Li, Xiuwei Li, Tenghao Yang, Xin Li, Mingzhe Yang, Yintang |
author_facet | Zhao, Dongyan Wang, Yubo Chen, Yanning Shao, Jin Fu, Zhen Duan, Baoxing Liu, Fang Li, Xiuwei Li, Tenghao Yang, Xin Li, Mingzhe Yang, Yintang |
author_sort | Zhao, Dongyan |
collection | PubMed |
description | A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which transfers the breakdown point from the high electric field region to the low electric field region, and the S-FLI VDMOS structure uses multiple layers of charge compensation blocks to generate multiple electric field peaks in the drift region in order to optimize the electric field distribution. In the TCAD simulation, the BV of the proposed S-FLI VDMOS is improved to 326 V, which is higher than that of 281 V for the conventional Si VDMOS with the same drift region length of 15 μm, and the R(on,sp) is reduced from 21.54 mΩ·cm(2) for the conventional Si VDMOS to 7.77 mΩ·cm(2) for the S-FLI VDMOS. Compared with the conventional Si VDMOS, the current density of the effective current conduction path is increased when the forward bias is applied to the proposed device. |
format | Online Article Text |
id | pubmed-9031301 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-90313012022-04-23 Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation Zhao, Dongyan Wang, Yubo Chen, Yanning Shao, Jin Fu, Zhen Duan, Baoxing Liu, Fang Li, Xiuwei Li, Tenghao Yang, Xin Li, Mingzhe Yang, Yintang Micromachines (Basel) Article A novel VDMOS with Step Floating Islands VDMOS (S-FLI VDMOS) is proposed for the first time in this letter, in order to optimize the breakdown voltage (BV) and the specific on-resistance (R(on,sp)). The innovative terminal technology of Breakdown Point Transfer (BPT) is applied to S-FLI VDMOS, which transfers the breakdown point from the high electric field region to the low electric field region, and the S-FLI VDMOS structure uses multiple layers of charge compensation blocks to generate multiple electric field peaks in the drift region in order to optimize the electric field distribution. In the TCAD simulation, the BV of the proposed S-FLI VDMOS is improved to 326 V, which is higher than that of 281 V for the conventional Si VDMOS with the same drift region length of 15 μm, and the R(on,sp) is reduced from 21.54 mΩ·cm(2) for the conventional Si VDMOS to 7.77 mΩ·cm(2) for the S-FLI VDMOS. Compared with the conventional Si VDMOS, the current density of the effective current conduction path is increased when the forward bias is applied to the proposed device. MDPI 2022-04-04 /pmc/articles/PMC9031301/ /pubmed/35457878 http://dx.doi.org/10.3390/mi13040573 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Zhao, Dongyan Wang, Yubo Chen, Yanning Shao, Jin Fu, Zhen Duan, Baoxing Liu, Fang Li, Xiuwei Li, Tenghao Yang, Xin Li, Mingzhe Yang, Yintang Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title | Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title_full | Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title_fullStr | Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title_full_unstemmed | Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title_short | Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation |
title_sort | novel step floating islands vdmos with low specific on-resistance by tcad simulation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031301/ https://www.ncbi.nlm.nih.gov/pubmed/35457878 http://dx.doi.org/10.3390/mi13040573 |
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