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Enhancement of the Bond Strength and Reduction of Wafer Edge Voids in Hybrid Bonding
The hybrid wafer bonding technique is drawing much interest in relation to three-dimensional integration technology, and its areas of application are expanding from image sensors to semiconductor memory packages. In hybrid bonding, the bond strength and void formation are the main issues influencing...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031334/ https://www.ncbi.nlm.nih.gov/pubmed/35457842 http://dx.doi.org/10.3390/mi13040537 |