A Synchrotron Radiation Photoemission Study of SiGe(001)-2×1 Grown on Ge and Si Substrates: The Surface Electronic Structure for Various Ge Concentrations

Beyond the macroscopic perspective, this study microscopically investigates Si(1−x)Ge(x)(001)-2×1 samples that were grown on the epi Ge(001) and epi Si(001) substrates via molecular-beam epitaxy, using the high-resolution synchrotron radiation photoelectron spectroscopy (SRPES) as a probe. The low-e...

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Detalles Bibliográficos
Autores principales: Cheng, Yi-Ting, Wan, Hsien-Wen, Kwo, Jueinai, Hong, Minghwei, Pi, Tun-Wen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031588/
https://www.ncbi.nlm.nih.gov/pubmed/35458017
http://dx.doi.org/10.3390/nano12081309

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031588/
https://www.ncbi.nlm.nih.gov/pubmed/35458017
http://dx.doi.org/10.3390/nano12081309

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