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An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation

In the present study, crystallization of amorphous-Si (a-Si) in Al/a-Si bilayer thin films under thermal annealing and ion irradiation has been investigated for future solar energy materials applications. In particular, the effect of thickness ratio (e.g. in Al : a-Si, the ratio of the Al and a-Si l...

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Autores principales: Maity, G., Dubey, S., El-Azab, Anter, Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., Patel, Shiv P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9049056/
https://www.ncbi.nlm.nih.gov/pubmed/35495262
http://dx.doi.org/10.1039/c9ra08836a
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author Maity, G.
Dubey, S.
El-Azab, Anter
Singhal, R.
Ojha, S.
Kulriya, P. K.
Dhar, S.
Som, T.
Kanjilal, D.
Patel, Shiv P.
author_facet Maity, G.
Dubey, S.
El-Azab, Anter
Singhal, R.
Ojha, S.
Kulriya, P. K.
Dhar, S.
Som, T.
Kanjilal, D.
Patel, Shiv P.
author_sort Maity, G.
collection PubMed
description In the present study, crystallization of amorphous-Si (a-Si) in Al/a-Si bilayer thin films under thermal annealing and ion irradiation has been investigated for future solar energy materials applications. In particular, the effect of thickness ratio (e.g. in Al : a-Si, the ratio of the Al and a-Si layer thickness) and temperature during irradiation on crystallization of the Si films has been explored for the first time. Two sets of samples with thickness ratio 1 : 1 (set-A: 50 nm Al/50 nm a-Si) and thickness ratio 1 : 3 (set-B: 50 nm Al/150 nm a-Si) have been prepared on thermally oxidized Si-substrates. In one experiment, thermal annealing of the as-prepared sample (of both the sets) has been done at different temperatures of 100 °C, 200 °C, 300 °C, 400 °C, and 500 °C. Significant crystallization was found to initiate at 200 °C with the help of thermal annealing, which increased further by increasing the temperature. In another experiment, ion irradiation on both sets of samples has been carried out at 100 °C and 200 °C using 100 MeV Ni(7+) ions with fluences of 1 × 10(12) ions per cm(2), 5 × 10(12) ions per cm(2), 1 × 10(13) ions per cm(2), and 5 × 10(13) ions per cm(2). Significant crystallization of Si was observed at a remarkably low temperature of 100 °C under ion irradiation. The samples irradiated at 100 °C show better crystallization than the samples irradiated at 200 °C. The maximum crystallization of a-Si has been observed at a fluence of 1 × 10(12) ions per cm(2), which was found to decrease with increasing ion fluence at both temperatures (i.e. 100 °C & 200 °C). The crystallization of a-Si is found to be better for set-B samples as compared to set-A samples at all the fluences and irradiation temperatures. The present work is aimed at developing the understanding of the crystallization process, which may have significant advantages for designing crystalline layers at lower temperature using appropriate masks for irradiation at the desired location. The detailed mechanisms behind all the above observations are discussed in this paper.
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spelling pubmed-90490562022-04-28 An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation Maity, G. Dubey, S. El-Azab, Anter Singhal, R. Ojha, S. Kulriya, P. K. Dhar, S. Som, T. Kanjilal, D. Patel, Shiv P. RSC Adv Chemistry In the present study, crystallization of amorphous-Si (a-Si) in Al/a-Si bilayer thin films under thermal annealing and ion irradiation has been investigated for future solar energy materials applications. In particular, the effect of thickness ratio (e.g. in Al : a-Si, the ratio of the Al and a-Si layer thickness) and temperature during irradiation on crystallization of the Si films has been explored for the first time. Two sets of samples with thickness ratio 1 : 1 (set-A: 50 nm Al/50 nm a-Si) and thickness ratio 1 : 3 (set-B: 50 nm Al/150 nm a-Si) have been prepared on thermally oxidized Si-substrates. In one experiment, thermal annealing of the as-prepared sample (of both the sets) has been done at different temperatures of 100 °C, 200 °C, 300 °C, 400 °C, and 500 °C. Significant crystallization was found to initiate at 200 °C with the help of thermal annealing, which increased further by increasing the temperature. In another experiment, ion irradiation on both sets of samples has been carried out at 100 °C and 200 °C using 100 MeV Ni(7+) ions with fluences of 1 × 10(12) ions per cm(2), 5 × 10(12) ions per cm(2), 1 × 10(13) ions per cm(2), and 5 × 10(13) ions per cm(2). Significant crystallization of Si was observed at a remarkably low temperature of 100 °C under ion irradiation. The samples irradiated at 100 °C show better crystallization than the samples irradiated at 200 °C. The maximum crystallization of a-Si has been observed at a fluence of 1 × 10(12) ions per cm(2), which was found to decrease with increasing ion fluence at both temperatures (i.e. 100 °C & 200 °C). The crystallization of a-Si is found to be better for set-B samples as compared to set-A samples at all the fluences and irradiation temperatures. The present work is aimed at developing the understanding of the crystallization process, which may have significant advantages for designing crystalline layers at lower temperature using appropriate masks for irradiation at the desired location. The detailed mechanisms behind all the above observations are discussed in this paper. The Royal Society of Chemistry 2020-01-27 /pmc/articles/PMC9049056/ /pubmed/35495262 http://dx.doi.org/10.1039/c9ra08836a Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by-nc/3.0/
spellingShingle Chemistry
Maity, G.
Dubey, S.
El-Azab, Anter
Singhal, R.
Ojha, S.
Kulriya, P. K.
Dhar, S.
Som, T.
Kanjilal, D.
Patel, Shiv P.
An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title_full An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title_fullStr An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title_full_unstemmed An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title_short An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
title_sort assessment on crystallization phenomena of si in al/a-si thin films via thermal annealing and ion irradiation
topic Chemistry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9049056/
https://www.ncbi.nlm.nih.gov/pubmed/35495262
http://dx.doi.org/10.1039/c9ra08836a
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