Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides

The annealing temperature (T(a)) dependence of the structural, morphological, electrical and dielectric properties of ZnS thin films was investigated. In this work, we consider the as-deposited and annealed ZnS thin films at different temperatures. The as-deposited films were amorphous in nature. Ho...

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Detalles Bibliográficos
Autores principales: Koaib, J., Bouguila, N., Abassi, H., Moutia, N., Kraini, M., Timoumi, A., Vázquez-Vázquez, C., Khirouni, K., Alaya, S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9050135/
https://www.ncbi.nlm.nih.gov/pubmed/35497222
http://dx.doi.org/10.1039/c9ra10284a

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9050135/
https://www.ncbi.nlm.nih.gov/pubmed/35497222
http://dx.doi.org/10.1039/c9ra10284a

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