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Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides
The annealing temperature (T(a)) dependence of the structural, morphological, electrical and dielectric properties of ZnS thin films was investigated. In this work, we consider the as-deposited and annealed ZnS thin films at different temperatures. The as-deposited films were amorphous in nature. Ho...
Autores principales: | Koaib, J., Bouguila, N., Abassi, H., Moutia, N., Kraini, M., Timoumi, A., Vázquez-Vázquez, C., Khirouni, K., Alaya, S. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9050135/ https://www.ncbi.nlm.nih.gov/pubmed/35497222 http://dx.doi.org/10.1039/c9ra10284a |
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