Quantification of defects engineered in single layer MoS(2)

Atomic defects are controllably introduced in suspended single layer molybdenum disulfide (1L MoS(2)) using helium ion beam. Vacancies exhibit one missing atom of molybdenum and a few atoms of sulfur. Quantification was done using a Scanning Transmission Electron Microscope (STEM) with an annular de...

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Detalles Bibliográficos
Autores principales: Aryeetey, Frederick, Ignatova, Tetyana, Aravamudhan, Shyam
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9054692/
https://www.ncbi.nlm.nih.gov/pubmed/35520301
http://dx.doi.org/10.1039/d0ra03372c

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9054692/
https://www.ncbi.nlm.nih.gov/pubmed/35520301
http://dx.doi.org/10.1039/d0ra03372c

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