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Quantification of defects engineered in single layer MoS(2)
Atomic defects are controllably introduced in suspended single layer molybdenum disulfide (1L MoS(2)) using helium ion beam. Vacancies exhibit one missing atom of molybdenum and a few atoms of sulfur. Quantification was done using a Scanning Transmission Electron Microscope (STEM) with an annular de...
Autores principales: | Aryeetey, Frederick, Ignatova, Tetyana, Aravamudhan, Shyam |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9054692/ https://www.ncbi.nlm.nih.gov/pubmed/35520301 http://dx.doi.org/10.1039/d0ra03372c |
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