Realistic dielectric response of high temperature sintered ZnO ceramic: a microscopic and spectroscopic approach

High temperature sintering (1200–1400 °C) has been performed on ZnO ceramics. An X-ray Absorption Fine Structure (XAFS) study shows that high sintering temperature introduces a constant amount of V(O) and V(Zn) defects without any significant effect on the crystal or electronic structure of Wurtzite...

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Detalles Bibliográficos
Autores principales: Ibadat, Sidra, Younas, Muhammad, Shahzada, Shaista, Nadeem, Muhammad, Ali, Tahir, Akhtar, Muhammad Javed, Pollastri, Simone, Rehman, Ubaid-Ur, Yousef, Ibraheem, Ali Khan, Rao Tahir
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9056371/
https://www.ncbi.nlm.nih.gov/pubmed/35516023
http://dx.doi.org/10.1039/d0ra04273k

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9056371/
https://www.ncbi.nlm.nih.gov/pubmed/35516023
http://dx.doi.org/10.1039/d0ra04273k

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