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Universal machine learning framework for defect predictions in zinc blende semiconductors

We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table...

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Detalles Bibliográficos
Autores principales: Mannodi-Kanakkithodi, Arun, Xiang, Xiaofeng, Jacoby, Laura, Biegaj, Robert, Dunham, Scott T., Gamelin, Daniel R., Chan, Maria K.Y.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9058924/
https://www.ncbi.nlm.nih.gov/pubmed/35510195
http://dx.doi.org/10.1016/j.patter.2022.100450
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author Mannodi-Kanakkithodi, Arun
Xiang, Xiaofeng
Jacoby, Laura
Biegaj, Robert
Dunham, Scott T.
Gamelin, Daniel R.
Chan, Maria K.Y.
author_facet Mannodi-Kanakkithodi, Arun
Xiang, Xiaofeng
Jacoby, Laura
Biegaj, Robert
Dunham, Scott T.
Gamelin, Daniel R.
Chan, Maria K.Y.
author_sort Mannodi-Kanakkithodi, Arun
collection PubMed
description We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table are considered as impurity atoms at the cation, anion, or interstitial sites in supercells of 34 candidate semiconductors, leading to a chemical space of approximately 12,000 points, 10% of which are used to generate a DFT dataset of charge dependent defect formation energies. Descriptors based on tabulated elemental properties, defect coordination environment, and relevant semiconductor properties are used to train ML regression models for the DFT computed neutral state formation energies and charge transition levels of impurities. Optimized kernel ridge, Gaussian process, random forest, and neural network regression models are applied to screen impurities with lower formation energy than dominant native defects in all compounds.
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spelling pubmed-90589242022-05-03 Universal machine learning framework for defect predictions in zinc blende semiconductors Mannodi-Kanakkithodi, Arun Xiang, Xiaofeng Jacoby, Laura Biegaj, Robert Dunham, Scott T. Gamelin, Daniel R. Chan, Maria K.Y. Patterns (N Y) Article We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table are considered as impurity atoms at the cation, anion, or interstitial sites in supercells of 34 candidate semiconductors, leading to a chemical space of approximately 12,000 points, 10% of which are used to generate a DFT dataset of charge dependent defect formation energies. Descriptors based on tabulated elemental properties, defect coordination environment, and relevant semiconductor properties are used to train ML regression models for the DFT computed neutral state formation energies and charge transition levels of impurities. Optimized kernel ridge, Gaussian process, random forest, and neural network regression models are applied to screen impurities with lower formation energy than dominant native defects in all compounds. Elsevier 2022-02-14 /pmc/articles/PMC9058924/ /pubmed/35510195 http://dx.doi.org/10.1016/j.patter.2022.100450 Text en © 2022 The Authors https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Article
Mannodi-Kanakkithodi, Arun
Xiang, Xiaofeng
Jacoby, Laura
Biegaj, Robert
Dunham, Scott T.
Gamelin, Daniel R.
Chan, Maria K.Y.
Universal machine learning framework for defect predictions in zinc blende semiconductors
title Universal machine learning framework for defect predictions in zinc blende semiconductors
title_full Universal machine learning framework for defect predictions in zinc blende semiconductors
title_fullStr Universal machine learning framework for defect predictions in zinc blende semiconductors
title_full_unstemmed Universal machine learning framework for defect predictions in zinc blende semiconductors
title_short Universal machine learning framework for defect predictions in zinc blende semiconductors
title_sort universal machine learning framework for defect predictions in zinc blende semiconductors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9058924/
https://www.ncbi.nlm.nih.gov/pubmed/35510195
http://dx.doi.org/10.1016/j.patter.2022.100450
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