Cargando…
Universal machine learning framework for defect predictions in zinc blende semiconductors
We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table...
Autores principales: | , , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9058924/ https://www.ncbi.nlm.nih.gov/pubmed/35510195 http://dx.doi.org/10.1016/j.patter.2022.100450 |
_version_ | 1784698217042018304 |
---|---|
author | Mannodi-Kanakkithodi, Arun Xiang, Xiaofeng Jacoby, Laura Biegaj, Robert Dunham, Scott T. Gamelin, Daniel R. Chan, Maria K.Y. |
author_facet | Mannodi-Kanakkithodi, Arun Xiang, Xiaofeng Jacoby, Laura Biegaj, Robert Dunham, Scott T. Gamelin, Daniel R. Chan, Maria K.Y. |
author_sort | Mannodi-Kanakkithodi, Arun |
collection | PubMed |
description | We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table are considered as impurity atoms at the cation, anion, or interstitial sites in supercells of 34 candidate semiconductors, leading to a chemical space of approximately 12,000 points, 10% of which are used to generate a DFT dataset of charge dependent defect formation energies. Descriptors based on tabulated elemental properties, defect coordination environment, and relevant semiconductor properties are used to train ML regression models for the DFT computed neutral state formation energies and charge transition levels of impurities. Optimized kernel ridge, Gaussian process, random forest, and neural network regression models are applied to screen impurities with lower formation energy than dominant native defects in all compounds. |
format | Online Article Text |
id | pubmed-9058924 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Elsevier |
record_format | MEDLINE/PubMed |
spelling | pubmed-90589242022-05-03 Universal machine learning framework for defect predictions in zinc blende semiconductors Mannodi-Kanakkithodi, Arun Xiang, Xiaofeng Jacoby, Laura Biegaj, Robert Dunham, Scott T. Gamelin, Daniel R. Chan, Maria K.Y. Patterns (N Y) Article We develop a framework powered by machine learning (ML) and high-throughput density functional theory (DFT) computations for the prediction and screening of functional impurities in groups IV, III–V, and II–VI zinc blende semiconductors. Elements spanning the length and breadth of the periodic table are considered as impurity atoms at the cation, anion, or interstitial sites in supercells of 34 candidate semiconductors, leading to a chemical space of approximately 12,000 points, 10% of which are used to generate a DFT dataset of charge dependent defect formation energies. Descriptors based on tabulated elemental properties, defect coordination environment, and relevant semiconductor properties are used to train ML regression models for the DFT computed neutral state formation energies and charge transition levels of impurities. Optimized kernel ridge, Gaussian process, random forest, and neural network regression models are applied to screen impurities with lower formation energy than dominant native defects in all compounds. Elsevier 2022-02-14 /pmc/articles/PMC9058924/ /pubmed/35510195 http://dx.doi.org/10.1016/j.patter.2022.100450 Text en © 2022 The Authors https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Article Mannodi-Kanakkithodi, Arun Xiang, Xiaofeng Jacoby, Laura Biegaj, Robert Dunham, Scott T. Gamelin, Daniel R. Chan, Maria K.Y. Universal machine learning framework for defect predictions in zinc blende semiconductors |
title | Universal machine learning framework for defect predictions in zinc blende semiconductors |
title_full | Universal machine learning framework for defect predictions in zinc blende semiconductors |
title_fullStr | Universal machine learning framework for defect predictions in zinc blende semiconductors |
title_full_unstemmed | Universal machine learning framework for defect predictions in zinc blende semiconductors |
title_short | Universal machine learning framework for defect predictions in zinc blende semiconductors |
title_sort | universal machine learning framework for defect predictions in zinc blende semiconductors |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9058924/ https://www.ncbi.nlm.nih.gov/pubmed/35510195 http://dx.doi.org/10.1016/j.patter.2022.100450 |
work_keys_str_mv | AT mannodikanakkithodiarun universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT xiangxiaofeng universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT jacobylaura universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT biegajrobert universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT dunhamscottt universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT gamelindanielr universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors AT chanmariaky universalmachinelearningframeworkfordefectpredictionsinzincblendesemiconductors |