Blisters on graphite surface: a scanning microwave microscopy investigation

Scanning microwave microscopy (SMM) is based on the interaction between a sample and an electromagnetic evanescent field, in the microwave frequency range. SMM is usually coupled with a scanning probe microscopy (SPM) technique such as in our case, a scanning tunneling microscope (STM). In this way,...

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Detalles Bibliográficos
Autores principales: Pavoni, Eleonora, Yivlialin, Rossella, Hardly Joseph, Christopher, Fabi, Gianluca, Mencarelli, Davide, Pierantoni, Luca, Bussetti, Gianlorenzo, Farina, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2019
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9067255/
https://www.ncbi.nlm.nih.gov/pubmed/35514520
http://dx.doi.org/10.1039/c9ra04667d

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9067255/
https://www.ncbi.nlm.nih.gov/pubmed/35514520
http://dx.doi.org/10.1039/c9ra04667d

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