X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...

Descripción completa

Detalles Bibliográficos
Autores principales: Konovalov, Oleg V., Belova, Valentina, La Porta, Francesco, Saedi, Mehdi, Groot, Irene M. N., Renaud, Gilles, Snigireva, Irina, Snigirev, Anatoly, Voevodina, Maria, Shen, Chen, Sartori, Andrea, Murphy, Bridget M., Jankowski, Maciej
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/
https://www.ncbi.nlm.nih.gov/pubmed/35511004
http://dx.doi.org/10.1107/S1600577522002053

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/
https://www.ncbi.nlm.nih.gov/pubmed/35511004
http://dx.doi.org/10.1107/S1600577522002053

Ejemplares similares