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X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...
Autores principales: | , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/ https://www.ncbi.nlm.nih.gov/pubmed/35511004 http://dx.doi.org/10.1107/S1600577522002053 |
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author | Konovalov, Oleg V. Belova, Valentina La Porta, Francesco Saedi, Mehdi Groot, Irene M. N. Renaud, Gilles Snigireva, Irina Snigirev, Anatoly Voevodina, Maria Shen, Chen Sartori, Andrea Murphy, Bridget M. Jankowski, Maciej |
author_facet | Konovalov, Oleg V. Belova, Valentina La Porta, Francesco Saedi, Mehdi Groot, Irene M. N. Renaud, Gilles Snigireva, Irina Snigirev, Anatoly Voevodina, Maria Shen, Chen Sartori, Andrea Murphy, Bridget M. Jankowski, Maciej |
author_sort | Konovalov, Oleg V. |
collection | PubMed |
description | The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å. |
format | Online Article Text |
id | pubmed-9070704 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-90707042022-05-10 X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper Konovalov, Oleg V. Belova, Valentina La Porta, Francesco Saedi, Mehdi Groot, Irene M. N. Renaud, Gilles Snigireva, Irina Snigirev, Anatoly Voevodina, Maria Shen, Chen Sartori, Andrea Murphy, Bridget M. Jankowski, Maciej J Synchrotron Radiat Research Papers The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å. International Union of Crystallography 2022-04-01 /pmc/articles/PMC9070704/ /pubmed/35511004 http://dx.doi.org/10.1107/S1600577522002053 Text en © Oleg V. Konovalov et al. 2022 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Konovalov, Oleg V. Belova, Valentina La Porta, Francesco Saedi, Mehdi Groot, Irene M. N. Renaud, Gilles Snigireva, Irina Snigirev, Anatoly Voevodina, Maria Shen, Chen Sartori, Andrea Murphy, Bridget M. Jankowski, Maciej X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title_full | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title_fullStr | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title_full_unstemmed | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title_short | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
title_sort | x-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/ https://www.ncbi.nlm.nih.gov/pubmed/35511004 http://dx.doi.org/10.1107/S1600577522002053 |
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