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X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...

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Autores principales: Konovalov, Oleg V., Belova, Valentina, La Porta, Francesco, Saedi, Mehdi, Groot, Irene M. N., Renaud, Gilles, Snigireva, Irina, Snigirev, Anatoly, Voevodina, Maria, Shen, Chen, Sartori, Andrea, Murphy, Bridget M., Jankowski, Maciej
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/
https://www.ncbi.nlm.nih.gov/pubmed/35511004
http://dx.doi.org/10.1107/S1600577522002053
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author Konovalov, Oleg V.
Belova, Valentina
La Porta, Francesco
Saedi, Mehdi
Groot, Irene M. N.
Renaud, Gilles
Snigireva, Irina
Snigirev, Anatoly
Voevodina, Maria
Shen, Chen
Sartori, Andrea
Murphy, Bridget M.
Jankowski, Maciej
author_facet Konovalov, Oleg V.
Belova, Valentina
La Porta, Francesco
Saedi, Mehdi
Groot, Irene M. N.
Renaud, Gilles
Snigireva, Irina
Snigirev, Anatoly
Voevodina, Maria
Shen, Chen
Sartori, Andrea
Murphy, Bridget M.
Jankowski, Maciej
author_sort Konovalov, Oleg V.
collection PubMed
description The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å.
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spelling pubmed-90707042022-05-10 X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper Konovalov, Oleg V. Belova, Valentina La Porta, Francesco Saedi, Mehdi Groot, Irene M. N. Renaud, Gilles Snigireva, Irina Snigirev, Anatoly Voevodina, Maria Shen, Chen Sartori, Andrea Murphy, Bridget M. Jankowski, Maciej J Synchrotron Radiat Research Papers The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å. International Union of Crystallography 2022-04-01 /pmc/articles/PMC9070704/ /pubmed/35511004 http://dx.doi.org/10.1107/S1600577522002053 Text en © Oleg V. Konovalov et al. 2022 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Konovalov, Oleg V.
Belova, Valentina
La Porta, Francesco
Saedi, Mehdi
Groot, Irene M. N.
Renaud, Gilles
Snigireva, Irina
Snigirev, Anatoly
Voevodina, Maria
Shen, Chen
Sartori, Andrea
Murphy, Bridget M.
Jankowski, Maciej
X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title_full X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title_fullStr X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title_full_unstemmed X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title_short X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
title_sort x-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070704/
https://www.ncbi.nlm.nih.gov/pubmed/35511004
http://dx.doi.org/10.1107/S1600577522002053
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