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Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base

Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is re...

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Detalles Bibliográficos
Autores principales: Said, Ayman H., Kim, Jung Ho, Aran, Emily K., Gog, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070708/
https://www.ncbi.nlm.nih.gov/pubmed/35511007
http://dx.doi.org/10.1107/S1600577522001886