Cargando…

Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base

Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is re...

Descripción completa

Detalles Bibliográficos
Autores principales: Said, Ayman H., Kim, Jung Ho, Aran, Emily K., Gog, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070708/
https://www.ncbi.nlm.nih.gov/pubmed/35511007
http://dx.doi.org/10.1107/S1600577522001886
_version_ 1784700697948717056
author Said, Ayman H.
Kim, Jung Ho
Aran, Emily K.
Gog, Thomas
author_facet Said, Ayman H.
Kim, Jung Ho
Aran, Emily K.
Gog, Thomas
author_sort Said, Ayman H.
collection PubMed
description Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is required, is very time-consuming, expensive and often a hit-or-miss affair. A novel fabrication technique is introduced, utilizing a concave-spherical, microporous aluminium base to hold an assembly of a thin glass substrate with a diced crystal wafer bonded to it. Under uniform vacuum forces, the glass substrate is drawn into the aluminium base, achieving the desired bending radius, while dicing of the diffracting crystal layer prevents bending strain from being imposed on the individual crystal pixels. This technique eliminates the need for permanently bonding the crystal assembly to the concave lens, offering the opportunity for correcting figure errors, avoiding long-term degradation of the permanent bond, and making both lens and crystal reusable. Process and material costs are thus substantially decreased. Two analyzers, Si(844) and Ge(337) with intrinsic resolutions of 14.6 meV and 36.5 meV, respectively, were produced in this fashion and characterized in resonant inelastic X-ray scattering (RIXS) measurements. The achieved overall energy resolutions for both analyzers were 29.4 meV for Si(844) and 56.6 meV for Ge(337). Although the RIXS technique is veru sensitive to analyzer imperfections, the analyzers were found to be equal, if not superior, in quality to their traditional, permanently bonded counterparts.
format Online
Article
Text
id pubmed-9070708
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher International Union of Crystallography
record_format MEDLINE/PubMed
spelling pubmed-90707082022-05-10 Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base Said, Ayman H. Kim, Jung Ho Aran, Emily K. Gog, Thomas J Synchrotron Radiat Research Papers Modern inelastic X-ray spectrometers employ curved, bent and diced analyzers to capture sufficiently large solid angles of radially emitted scattered radiation emanating from the sample. Fabricating these intricate analyzers, especially when a high energy resolution of a few millielectronvolts is required, is very time-consuming, expensive and often a hit-or-miss affair. A novel fabrication technique is introduced, utilizing a concave-spherical, microporous aluminium base to hold an assembly of a thin glass substrate with a diced crystal wafer bonded to it. Under uniform vacuum forces, the glass substrate is drawn into the aluminium base, achieving the desired bending radius, while dicing of the diffracting crystal layer prevents bending strain from being imposed on the individual crystal pixels. This technique eliminates the need for permanently bonding the crystal assembly to the concave lens, offering the opportunity for correcting figure errors, avoiding long-term degradation of the permanent bond, and making both lens and crystal reusable. Process and material costs are thus substantially decreased. Two analyzers, Si(844) and Ge(337) with intrinsic resolutions of 14.6 meV and 36.5 meV, respectively, were produced in this fashion and characterized in resonant inelastic X-ray scattering (RIXS) measurements. The achieved overall energy resolutions for both analyzers were 29.4 meV for Si(844) and 56.6 meV for Ge(337). Although the RIXS technique is veru sensitive to analyzer imperfections, the analyzers were found to be equal, if not superior, in quality to their traditional, permanently bonded counterparts. International Union of Crystallography 2022-04-01 /pmc/articles/PMC9070708/ /pubmed/35511007 http://dx.doi.org/10.1107/S1600577522001886 Text en © Said, Kim, Aran and Gog 2022 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Said, Ayman H.
Kim, Jung Ho
Aran, Emily K.
Gog, Thomas
Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title_full Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title_fullStr Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title_full_unstemmed Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title_short Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
title_sort novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070708/
https://www.ncbi.nlm.nih.gov/pubmed/35511007
http://dx.doi.org/10.1107/S1600577522001886
work_keys_str_mv AT saidaymanh novelfabricationtechniqueforhighresolutionsphericalcrystalanalyzersusingamicroporousaluminiumbase
AT kimjungho novelfabricationtechniqueforhighresolutionsphericalcrystalanalyzersusingamicroporousaluminiumbase
AT aranemilyk novelfabricationtechniqueforhighresolutionsphericalcrystalanalyzersusingamicroporousaluminiumbase
AT gogthomas novelfabricationtechniqueforhighresolutionsphericalcrystalanalyzersusingamicroporousaluminiumbase