Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III

Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline...

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Detalles Bibliográficos
Autores principales: Glazyrin, K., Khandarkhaeva, S., Fedotenko, T., Dong, W., Laniel, D., Seiboth, F., Schropp, A., Garrevoet, J., Brückner, D., Falkenberg, G., Kubec, A., David, C., Wendt, M., Wenz, S., Dubrovinsky, L., Dubrovinskaia, N., Liermann, H.-P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070721/
https://www.ncbi.nlm.nih.gov/pubmed/35510998
http://dx.doi.org/10.1107/S1600577522002582

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070721/
https://www.ncbi.nlm.nih.gov/pubmed/35510998
http://dx.doi.org/10.1107/S1600577522002582

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