Cargando…
Topography inversion in scanning tunneling microscopy of single-atom-thick materials from penetrating substrate states
Scanning tunneling microscopy (STM) is one of the indispensable tools to characterize surface structures, but the distinction between atomic geometry and electronic effects based on the measured tunneling current is not always straightforward. In particular, for single-atomic-thick materials (graphe...
| Autores principales: | , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9072348/ https://www.ncbi.nlm.nih.gov/pubmed/35513468 http://dx.doi.org/10.1038/s41598-022-10870-0 |