High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map

BACKGROUND: Yield-related traits including thousand grain weight (TGW), grain number per spike (GNS), grain width (GW), grain length (GL), plant height (PH), spike length (SL), and spikelet number per spike (SNS) are greatly associated with grain yield of wheat (Triticum aestivum L.). To detect quan...

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Detalles Bibliográficos
Autores principales: Li, Tao, Li, Qiao, Wang, Jinhui, Yang, Zhao, Tang, Yanyan, Su, Yan, Zhang, Juanyu, Qiu, Xvebing, Pu, Xi, Pan, Zhifen, Zhang, Haili, Liang, Junjun, Liu, Zehou, Li, Jun, Yan, Wuyun, Yu, Maoqun, Long, Hai, Wei, Yuming, Deng, Guangbing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2022
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9107147/
https://www.ncbi.nlm.nih.gov/pubmed/35562674
http://dx.doi.org/10.1186/s12863-022-01050-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9107147/
https://www.ncbi.nlm.nih.gov/pubmed/35562674
http://dx.doi.org/10.1186/s12863-022-01050-0

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